Name : X-ray Diffractometer
Make : RIGAKU
Model : Smart lab 3KW
Application :

• Crystal lattice parameters
• Crystal orientation
• Particle /por-size analysis
• Nano Structural Analysis
• Residual Stress determination
• Thin Film analysis including:
• Thin film thickness, density, roughness
• Reflectivity Thickness and Roughness measurements.

Rocking Curve and Reciprocal Space Mapping.